Boundary-Scan ATE Integration
 

To improve the overall test coverage of assembled boards JTAG Technologies boundary-scan tools can be simply combine with existing automatic test equipment (ATE). JTAG Technology works with any vendor of in-circuit testers (ICT), flying probes (FPT) or functional testers (FT).

ATE integration is completely trouble free and merely involves adapting execution software to operate in the specific ATE environment. In many cases JTAG Technology develops dedicated, customized versions of the boundary-scan controllers or pods. This simplifies mechanical integration and preserves signal integrity.

The level of integration varies according to customer needs and could involve:

  • A basic combination of application execution and diagnostic modules to allow a single operator GUI
  • A fully interlaced solution which drives test signals via boundary-scan and senses them via the native tester’s pin or probe

JTAG Technology is offering solutions for following systems:

  • Aeroflex
  • Keysight (Agilent)
  • Digital Test
  • Huntron
  • Seica
  • SPEA
  • Takaya
  • Teredyne
  • And others

Please contact WG Electronics to get more information or quotes.